
pl. M. Borna 9
rafal.lewandkow2@uwr.edu.pl
tel. +48 71 375 93 19, +48 71 375 93 10
Interested
- photoelectron spectroscopy
- xps
- ups
- interface
- thin films
- gan
- valence band
- semiconductor
- general physics
- thin film
Scientific discipline
- physical sciences
Latest publications
- Influence of Graphite Layer on Electronic Properties of MgO/6H-SiC(0001) Interface
- Interfacial Polarization of Thin Alq3 , Gaq3 , and Erq3 Films on GaN(0001)
- Interactions between PTCDI-C8 and Si(100) Surface
- Niobium oxides films on GaN: Photoelectron spectroscopy study
- Interface formation of Al2O3 on carbon enriched 6H-SiC(0001): Photoelectron spectroscopy studies
- Obtaining Niobium Nitride on n-GaN by Surface Mediated Nitridation Technique
- Properties of Thin MgO Films on 6H–SiC and GaN: Photoelectron Studies
- Interface formation of Al2O3 on n-GaN(0001): Photoelectron spectroscopy studies
- Photoelectron spectroscopy studies on Al2O3 films on p-GaN(0001)
- Hafnium and Nitrogen Interaction at Hf/GaN(0001) Interface